Accurate Reliability Analysis of Concurrent Checking Circuits Employing An Efficient Analytical Method

Ting An (1, 2) , Kaikai Liu (1, 2) , Hao Cai (1, 2) , Lirida Naviner (1, 2)

1 SSH - Secure and Safe Hardware
2 COMELEC - Département Communications & Electronique

Mots clés: Concurrent error detection; Multiple faults; Reliability; Radiation-related effects

Domaines: Micro et nanotechnologies/Microélectronique; Electronique

Ting An, Kaikai Liu, Hao Cai, Lirida Naviner. Accurate Reliability Analysis of Concurrent Checking Circuits Employing An Efficient Analytical Method. Microelectronics Reliability, 2015, 55 (3-4), pp.696-703. ⟨hal-01122423⟩